Atomic Scale Characterization and First-Principles Studies - download pdf or read online

By Weronika Walkosz

ISBN-10: 144197816X

ISBN-13: 9781441978165

ISBN-10: 1441978178

ISBN-13: 9781441978172

This thesis offers effects from a mixed atomic-resolution Z-contrast and annular bright-field imaging and electron power loss spectroscopy within the Scanning Transmission Electron Microscopy, in addition to first rules reports of the interfaces among crystalline β−Si3N4 and amorphous (i) CeO2-x in addition to (ii) SiO2 intergranular movie (IGF). those interfaces are of an outstanding basic and technological curiosity simply because they play a tremendous function within the microstructural evolution and mechanical homes of Si3N4 ceramics utilized in many extreme temperature and strain functions. the most contribution of this paintings is its targeted description of the bonding features of light atoms, particularly oxygen and nitrogen, at those interfaces, which has now not been accomplished earlier than. The atomic-scale details at the association of either mild and heavy atoms is important for real looking modeling of interface homes, reminiscent of interface energy and ion shipping, and may facilitate elevated keep an eye on over the functionality of ceramic and semiconductor fabrics for a wide-range of applications.

This Doctoral Thesis has been accredited by means of the collage of Illinois-Chicago, Chicago, USA.

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4c. As the beam is focused (Fig. 4d), the center of the Ronchigram displays the highest magnification. The comma-free axis is clearly defined by this position and all alignment and positioning of detectors and apertures can be performed with respect to this spot. Next, the illumination beam alignment can be checked by wobbling first the condenser lens excitation and then the microscope high tension. Any misalignment of the beam between the condenser and objective lenses, showing up as a periodic translation of Ronchigram features when the wobbling takes place, can be corrected with the condenser alignment coils.

As the beam is focused (Fig. 4d), the center of the Ronchigram displays the highest magnification. The comma-free axis is clearly defined by this position and all alignment and positioning of detectors and apertures can be performed with respect to this spot. Next, the illumination beam alignment can be checked by wobbling first the condenser lens excitation and then the microscope high tension. Any misalignment of the beam between the condenser and objective lenses, showing up as a periodic translation of Ronchigram features when the wobbling takes place, can be corrected with the condenser alignment coils.

The comma-free axis is clearly defined by this position and all alignment and positioning of detectors and apertures can be performed with respect to this spot. Next, the illumination beam alignment can be checked by wobbling first the condenser lens excitation and then the microscope high tension. Any misalignment of the beam between the condenser and objective lenses, showing up as a periodic translation of Ronchigram features when the wobbling takes place, can be corrected with the condenser alignment coils.

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Atomic Scale Characterization and First-Principles Studies of Si₃N₄ Interfaces by Weronika Walkosz


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