P. Ciarlini, E Filipe, A B Forbes, F Pavese, C Perruchet, B's Advanced Mathematical And Computational Tools in Metrology PDF

By P. Ciarlini, E Filipe, A B Forbes, F Pavese, C Perruchet, B R L Siebert

ISBN-10: 9812566740

ISBN-13: 9789812566744

This quantity collects the refereed contributions in line with the displays made on the 7th Workshop on complicated Mathematical and Computational instruments in Metrology, a discussion board for metrologists, mathematicians and software program engineers that might inspire a more desirable synthesis of talents, features and assets. the quantity includes articles by way of global well known metrologists and mathematicians serious about dimension technology and, including the six past volumes during this sequence, constitutes an authoritative resource of the mathematical, statistical and software program instruments precious in sleek metrology.

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Metallurgical Transactions B 8B, 479–487 (1977) N. Takahashi, T. Takeyama, K. Ito, T. Ito, K. Mihama, M. Watanabe, High temperature furnace for the electron microscope. J. Electron Microscopy 4, 16–23 (1956) S. Takeda, H. Yoshida, Atomic-resolution environmental TEM for quantitative in-situ microscopy in materials science. Microscopy 62(1), 193–203 (2013) S. Takeda, Y. Kuwauchi, H. Yoshida, Environmental transmission electron microscopy for catalyst materials using a spherical aberration corrector.

Sasaki, T. Tanji, S. Muto, S. Arai, Development of an environmental high-voltage electron microscope for reaction science. Microscopy 62(1), 205–215 (2013) N. Tanaka, J. Usukura, M. Kusunoki, Y. Saito, K. Sasaki, T. Tanji, S. Muto, S. Arai, Development of an environmental high voltage electron microscope and its application to nano and bio-materials. C. Tiemeijer, Measurement of Coulomb interactions in an electron beam monochromator. Ultramicroscopy 78, 53–62 (1999) T. Uchiyama, H. Yoshida, Y. Kuwauchi, S.

J. Phys. Chem. C 113, 1648–1656 (2009) S. Iijima, Helical microtubules of graphitic carbon. Nature 354, 56–58 (1991) T. Ito, K. Hiziya, A specimen reaction device for the electron microscope and its applications. J. R. Jinschek, S. Helveg, Image resolution and sensitivity in an environmental transmission electron microscope. R. Jinschek, Advances in the environmental transmission electron microscope (ETEM) for nanoscale in situ studies of gas–solid interactions. Chem. Commun. 50, 2696–2706 (2014) T.

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Advanced Mathematical And Computational Tools in Metrology (Series on Advances in Mathematics for Applied Sciences) by P. Ciarlini, E Filipe, A B Forbes, F Pavese, C Perruchet, B R L Siebert


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